tools/testing/nvdimm: Populate dirty shutdown data

Allow the unit tests to verify the retrieval of the dirty shutdown
count via smart commands, and allow the driver-load-time retrieval of
the smart health payload to be simulated by nfit_test.

Reviewed-by: Keith Busch <[e-mail]>
Signed-off-by: Dan Williams <[e-mail]>

drivers/acpi/nfit/core.c

···
 	return false;
 }
 
-static void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
+__weak void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
 {
 	struct nd_intel_smart smart = { 0 };
 	union acpi_object in_buf = {
···
 	nfit_mem->dsm_mask = acpi_desc->dimm_cmd_force_en;
 	nfit_mem->family = NVDIMM_FAMILY_INTEL;
 	adev = to_acpi_dev(acpi_desc);
-	if (!adev)
+	if (!adev) {
+		/* unit test case */
+		populate_shutdown_status(nfit_mem);
 		return 0;
+	}
 
 	adev_dimm = acpi_find_child_device(adev, device_handle, false);
 	nfit_mem->adev = adev_dimm;

tools/testing/nvdimm/Kbuild

···
 ACPI_SRC := $(DRIVERS)/acpi/nfit
 DAX_SRC := $(DRIVERS)/dax
 ccflags-y := -I$(src)/$(NVDIMM_SRC)/
+ccflags-y += -I$(src)/$(ACPI_SRC)/
 
 obj-$(CONFIG_LIBNVDIMM) += libnvdimm.o
 obj-$(CONFIG_BLK_DEV_PMEM) += nd_pmem.o

tools/testing/nvdimm/acpi_nfit_test.c

···
 #include <linux/module.h>
 #include <linux/printk.h>
 #include "watermark.h"
+#include <nfit.h>
 
 nfit_test_watermark(acpi_nfit);
+
+/* strong / override definition of nfit_intel_shutdown_status */
+void nfit_intel_shutdown_status(struct nfit_mem *nfit_mem)
+{
+	set_bit(NFIT_MEM_DIRTY_COUNT, &nfit_mem->flags);
+	nfit_mem->dirty_shutdown = 42;
+}

tools/testing/nvdimm/test/nfit.c

···
 		| ND_INTEL_SMART_ALARM_VALID
 		| ND_INTEL_SMART_USED_VALID
 		| ND_INTEL_SMART_SHUTDOWN_VALID
+		| ND_INTEL_SMART_SHUTDOWN_COUNT_VALID
 		| ND_INTEL_SMART_MTEMP_VALID
 		| ND_INTEL_SMART_CTEMP_VALID,
 	.health = ND_INTEL_SMART_NON_CRITICAL_HEALTH,
···
 	.ait_status = 1,
 	.life_used = 5,
 	.shutdown_state = 0,
+	.shutdown_count = 42,
 	.vendor_size = 0,
-	.shutdown_count = 100,
 };
 
 struct nfit_test_fw {